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Diagnosing reliability of integrated circuits using noises and the ESD effect

โœ Scribed by M. I. Gorlov; D. Yu. Smirnov; R. M. Tikhonov

Book ID
110214426
Publisher
Springer
Year
2010
Tongue
English
Weight
137 KB
Volume
39
Category
Article
ISSN
1063-7397

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## Abstract To investigate the reliability of ESD protection in smart power integrated circuits the ESD experiments are performed and degradation is analyzed by low frequency noise measurements. Combining the noise results with further failure analysis analytical methods we have examined a location