Device scaling limits of Si MOSFETs and their application dependencies

✍ Scribed by Frank, D.J.; Dennard, R.H.; Nowak, E.; Solomon, P.M.; Taur, Y.; Hon-Sum Philip Wong

• Book ID: 115536374
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 667 KB
• Volume: 89
• Category: Article
• ISSN: 0018-9219
• DOI: 10.1109/5.915374