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Device Modeling for Submicron FET Integrated Circuits

โœ Scribed by Chatterjee, P.


Book ID
117911406
Publisher
IEEE
Year
1982
Tongue
English
Weight
683 KB
Volume
5
Category
Article
ISSN
0148-6411

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A new statistical nonlinear model of GaAs FET MMICs which allows the representation of distance-dependent technological parameter variations by means of equivalent circuit parameters, and an automatic extraction procedure, are presented. The capability to reproduce statistical distribution has been