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Device for automatically measuring the temperature dependences of electrical conductivity, Hall coefficient, and magneto-resistance of semiconductors

✍ Scribed by G. L. Lyakhu; G. S. Korotchenkov; I. P. Molodyan

Publisher: Springer US
Year: 1979
Tongue: English
Weight: 274 KB
Volume: 22
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf00830061

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