Monitoring, diagnosis and control of ind
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S.M. Alexander; T.B. Gor
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Article
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1998
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Elsevier Science
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English
โ 245 KB
We present a framework for monitoring, diagnosis, and control of industrial processes. This framework utilizes the multiresolution analysis capability of wavelet theory. Wavelet coefficient patterns at different scales, under a variety of process conditions, are noted to form process f'mgerprints, t