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Development test programs for 1-shot systems: 2-state reliability and binary development-test results

✍ Scribed by Mu-Yeh Huang; McBeth, D.; Vardeman, S.B.


Book ID
114555555
Publisher
IEEE
Year
1996
Tongue
English
Weight
630 KB
Volume
45
Category
Article
ISSN
0018-9529

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