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Development programs for 1-shot systems: decoupled tests and redesigns, with the possibility of design degradation

โœ Scribed by Moon, M.J.; Vardeman, S.B.; McBeth, D.


Book ID
114555770
Publisher
IEEE
Year
1999
Tongue
English
Weight
926 KB
Volume
48
Category
Article
ISSN
0018-9529

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