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Development of tests for VLSI circuit testability at the upper design levels

✍ Scribed by L. A. Zolotorevich; A. V. Il’inkova

Book ID: 110153204
Publisher: SP MAIK Nauka/Interperiodica
Year: 2010
Tongue: English
Weight: 178 KB
Volume: 71
Category: Article
ISSN: 0005-1179
DOI: 10.1134/s0005117910090110

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