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Development of a new creep specimen for medium and high temperature tests

✍ Scribed by Dr.-Ing. B. Skrotzki; Dipl.-Phys. K. Neuking; Dr. Ch. Mayr; Prof. Dr.-Ing. G. Eggeler

Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
392 KB
Volume
29
Category
Article
ISSN
0933-5137

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✦ Synopsis

Abstract

A new creep sample geometry is presented which has round heads instead of threads to connect to the grips. This reduces high temperature adhesion problems considerably. In addition, the production of samples from materials which are difficult to machine or which requires expensive machining techniques is made easier using this geometry. The successful use of the sample is demonstrated by means of two examples.

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