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Development of a Measuring System for Microwave Dielectric Properties at 2.45 GHz

✍ Scribed by M. Regier; P. Fritz; H. Schubert

Publisher: John Wiley and Sons
Year: 2001
Tongue: German
Weight: 78 KB
Volume: 73
Category: Article
ISSN: 0009-286X
DOI: 10.1002/1522-2640(200106)73:6<698::aid-cite6983333>3.0.co;2-d

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