✦ LIBER ✦
Analysis for the reliability of the intrinsic base ion implantation of a 3 Ghz I2L bipolar process from the measure of integrated resistances: From the results, setting of rules for an expert system
✍ Scribed by J.-L. Loheac; F. Raoult; O. Bonnaud; M. Taurin
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 391 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0026-2714
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