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Development of a Brief Scale to Measure AIDS-Related Stigma in South Africa

โœ Scribed by Seth C. Kalichman; Leickness C. Simbayi; Sean Jooste; Yoesrie Toefy; Demetria Cain; Chauncey Cherry; Ashraf Kagee

Publisher
Springer
Year
2005
Tongue
English
Weight
87 KB
Volume
9
Category
Article
ISSN
1090-7165

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๐Ÿ“œ SIMILAR VOLUMES

Development of a brief scale to measure
Development of a brief scale to measure acculturation among Japanese Americans
โœ Lisa S. Meredith; Neil Wenger; Honghu Liu; Nancy Harada; Katherine Kahn ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 86 KB ๐Ÿ‘ 2 views

Objective: To introduce a brief scale for measuring the level of acculturation among Japanese Americans and to describe its development and utility. We also evaluate the relationship of demographic characteristics with acculturation in one sample of Japanese Americans.