✦ LIBER ✦

Deterministic BIST with Multiple Scan Chains

✍ Scribed by Gundolf Kiefer; Hans-Joachim Wunderlich

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Deterministic BIST with Partial Scan

✍ Gundolf Kiefer; Hans-Joachim Wunderlich 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 79 KB

Scan-BIST based on transition probabilit

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 234 KB

A Reconfigurable Scan Architecture With

✍ Dong Xiang; Yang Zhao; Chakrabarty, K.; Fujiwara, H. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 518 KB

Two-Dimensional Test Data Compression fo

✍ Hua-Guo Liang; Sybille Hellebrand; Hans-Joachim Wunderlich 📂 Article 📅 2002 🏛 Springer US 🌐 English ⚖ 438 KB

Scan BIST with biased scan test signals

✍ Dong Xiang; MingJing Chen; JiaGuang Sun 📂 Article 📅 2008 🏛 Science in China Press (SCP) 🌐 English ⚖ 743 KB

An Efficient Deterministic Test Pattern

✍ Wei-Lun Wang; Kuen-Jong Lee 📂 Article 📅 2002 🏛 Springer US 🌐 English ⚖ 187 KB