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Scan-BIST based on transition probabilities for circuits with single and multiple scan chains

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 117907473
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 234 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.854634

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