Determination of light elements using x-
β
Hans A. van Sprang; Mirjan H. J. Bekkers
π
Article
π
1998
π
John Wiley and Sons
π
English
β 310 KB
X-rays scattered from a material contain information on the composition of the sample. The relationship between the sample composition and the amount of scattered radiation was studied for low-Z materials. Use of Comptonscattered tubelines appears to be the preferred technique and a calibration is p