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Determining the aluminium occupancy on the active T-sites in zeolites using X-ray standing waves

✍ Scribed by van Bokhoven, Jeroen A.; Lee, Tien-Lin; Drakopoulos, Michael; Lamberti, Carlo; Thieß, Sebastian; Zegenhagen, Jörg


Book ID
109934423
Publisher
Nature Publishing Group
Year
2008
Tongue
English
Weight
827 KB
Volume
7
Category
Article
ISSN
1476-1122

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## Abstract Using simultaneous analysis of both the grazing incidence X‐ray reflectivity (GIXR) and the angular dependent fluorescence yield from ultrathin layer structures, the densities of thin La and LaN layers of 2–6 nm thickness enclosed by B~4~C layers have been determined with approximately