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Determining Generation–Recombination Characteristics of a Semiconductor–Dielectric Interface from the Current Kinetics of Surface Minority Carrier Generation

✍ Scribed by A. G. Zhdan; G. V. Chucheva


Book ID
111542612
Publisher
Springer
Year
2003
Tongue
English
Weight
51 KB
Volume
46
Category
Article
ISSN
0020-4412

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