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Determining the thermal generation rate of minority charge carriers at semiconductor-ultrathin oxide interfaces

✍ Scribed by E. I. Goldman; N. F. Kukharskaya; V. G. Naryshkina; G. V. Chucheva


Book ID
110168101
Publisher
Springer
Year
2011
Tongue
English
Weight
206 KB
Volume
54
Category
Article
ISSN
0020-4412

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