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Determination of traps in poly(p-phenylene vinylene) light emitting diodes by charge-based deep level transient spectroscopy

✍ Scribed by Gaudin, Olivier; Jackman, Richard B; Nguyen, Thien-Phap; Le Rendu, Philippe

Book ID: 118222682
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 398 KB
Volume: 90
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1403669

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