Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology

✍ Scribed by K.W. Alt; R.E. Yeats; C.P. Hutchinson; D.K. Kuhn; T.S. Low; M. Iwamoto; M.E. Adamski; R.L. Shimon; T.E. Shirley; M. Bonse; F.G. Kellert; D.C. D’Avanzo

• Book ID: 104057953
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 431 KB
• Volume: 47
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2007.02.007