Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis: Part II: Influence of the errors of theoretical quantities which are used in the evaluation procedure

✍ Scribed by M. Geretschläger

• Publisher: Elsevier Science
• Year: 1982
• Weight: 369 KB
• Volume: 203
• Category: Article
• ISSN: 0167-5087
• DOI: 10.1016/0167-5087(82)90665-2