Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis: Part I: Influence of the errors of yield measurements

✍ Scribed by M. Geretschlàger

• Publisher: Elsevier Science
• Year: 1982
• Weight: 356 KB
• Volume: 200
• Category: Article
• ISSN: 0167-5087
• DOI: 10.1016/0167-5087(82)90477-x