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Determination of third-order nonlinear optical susceptibilities of polysilane thin films

โœ Scribed by Callender, C. L.; Carere, C. A.; Albert, J.; Zhou, L.-L.; Worsfold, D. J.


Book ID
115394001
Publisher
Optical Society of America
Year
1992
Tongue
English
Weight
807 KB
Volume
9
Category
Article
ISSN
0740-3224

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Third-order nonlinear optical properties
โœ E. Xenogiannopoulou; P. Aloukos; S. Couris; E. Kaminska; A. Piotrowska; E. Dynow ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 678 KB

Au films of thickness ranging between 5 and 52 nm were prepared by sputtering on quartz substrates and their third-order nonlinear optical response was investigated by Optical Kerr effect (OKE) and Z-scan techniques using 532 nm, 35 ps laser pulses. All prepared films were characterized by XRD, AFM