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Determination of the thickness of Al[sub 2]O[sub 3] barriers in magnetic tunnel junctions

✍ Scribed by Buchanan, J. D. R.; Hase, T. P. A.; Tanner, B. K.; Hughes, N. D.; Hicken, R. J.

Book ID: 126052636
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 237 KB
Volume: 81
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1496131

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