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Determination of the thickness and spectral dependence of the refractive index of AlxIn1 −xSb epitaxial layers from reflectance spectra

✍ Scribed by Komkov, O. S.; Firsov, D. D.; Semenov, A. N.; Meltser, B. Ya.; Troshkov, S. I.; Pikhtin, A. N.; Ivanov, S. V.


Book ID
120025817
Publisher
Springer
Year
2013
Tongue
English
Weight
226 KB
Volume
47
Category
Article
ISSN
1063-7826

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