Thermal conductivity measurements of syn
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A.N. Petrovsky; A.O. Salnick; D.O. Mukhin; B.V. Spitsyn
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Article
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1992
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Elsevier Science
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English
⚖ 130 KB
The non-destructive and non-contact photothermal beam deflection method has been applied to thin synthetic diamond films to give thermal conductivity measurements. The thickness of the diamond film was 12-50 /zm on silicon and tungsten substrates. The maximum film thermal conductivity value obtained