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Determination of the residual stress depth profile of uniaxial compacted ruthenium powder samples by X-ray diffraction

✍ Scribed by P. Angerer; E. Neubauer; L.G. Yu; K.A. Khor


Book ID
113656510
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
209 KB
Volume
27
Category
Article
ISSN
0263-4368

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