𝔖 Bobbio Scriptorium
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Determination of the optical constants of metals and semiconductors by combining ellipsometry with electron spectroscopy microscopy and X-ray specular reflection analysis

✍ Scribed by G. Gergely; Z. Bodó; P. Croce


Book ID
118362350
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
804 KB
Volume
200
Category
Article
ISSN
0039-6028

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