✦ LIBER ✦

Determination of the deep levels and observation of the defect level related to iron in silicon by use of the DLTS method

✍ Scribed by Yi Cai Sun; Zhi Jin Wang; Dang Ji Bin

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of the entropy-factor of t

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A simple method for the determination of

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Interpretation of DLTS emission and capt

✍ Kaniewski, J. ;Kaniewska, M. ;Jeżewski, M. 📂 Article 📅 1989 🏛 John Wiley and Sons 🌐 English ⚖ 491 KB

A reliable guideline to maximize the det

✍ M. Hanine; M. Masmoudi 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 178 KB

Structural bonding of deep level defects

✍ Lowther, J E 📂 Article 📅 1980 🏛 Institute of Physics 🌐 English ⚖ 857 KB

High resolution deep level transient spe

✍ Evans-Freeman, J. H.; Kan, P. Y. Y.; Abdelgader, N. 📂 Article 📅 2002 🏛 American Institute of Physics 🌐 English ⚖ 249 KB