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Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data

✍ Scribed by Schuster, M; Gervais, P O; Jobst, B; Hösler, W; Averbeck, R; Riechert, H; Iberl, A; Stömmer, R

Book ID: 121349293
Publisher: Institute of Physics
Year: 1999
Tongue: English
Weight: 115 KB
Volume: 32
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/32/10A/312

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