𝔖 Bobbio Scriptorium

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Determination of surface defects using Compton scattering of gamma-ray of 662 KeV : 41070 Lopes, R.T.; Anjos, M.J. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1276–1278. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989.

Book ID: 113408293
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 144 KB
Volume: 28
Category: Article
ISSN: 0963-8695
DOI: 10.1016/0963-8695(95)91915-e

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