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Determination of piezoelectric coefficients of ferroelectric thin films using GaAs:Cr adaptive interferometer

✍ Scribed by V.V. Spirin; I.A. Sokolov; Kwangsoo No


Book ID
108233489
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
239 KB
Volume
36
Category
Article
ISSN
0030-3992

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me