Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer

✍ Scribed by Gerber, P.; Roelofs, A.; Lohse, O.; Kügeler, C.; Tiedke, S.; Böttger, U.; Waser, R.

• Book ID: 120184934
• Publisher: American Institute of Physics
• Year: 2003
• Tongue: English
• Weight: 438 KB
• Volume: 74
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.1544415