✦ LIBER ✦

Determination of Phase Transformation Depth Profiles with Synchrotron Radiation

✍ Scribed by KEITH D. KEEFER; TERRY A. MICHALSKE

Book ID: 110823579
Publisher: John Wiley and Sons
Year: 1987
Tongue: English
Weight: 599 KB
Volume: 70
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1987.tb04972.x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A new method of depth profile determinat

A new method of depth profile determination by synchrotron radiation

✍ K. Abbas; P. Midy; I. Brissaud; P. Chevallierr 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 311 KB

Hydrogen depth profile of Al-alloy vacuu

Hydrogen depth profile of Al-alloy vacuum chamber exposed to synchrotron radiation

✍ K Kanazawa; M Yanokura; M Aratani; H Akiyama 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 361 KB

Depth profiling of surface oxidized TiAl

Depth profiling of surface oxidized TiAlN film by synchrotron radiation excited X-ray photoelectron spectroscopy

✍ F. Esaka; K. Furuya; H. Shimada; M. Imamura; N. Matsubayashi; T. Sato; A. Nishij 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 383 KB

Accurate stopping power determination of

Accurate stopping power determination of 15N ions for hydrogen depth profiling by a combination of ion beams and synchrotron radiation

✍ M. Zier; U. Reinholz; H. Riesemeier; M. Radtke; F. Munnik 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 302 KB

Rapid determination of Fe 3 O 4 phase di

Rapid determination of Fe 3 O 4 phase diagram by synchrotron radiation

✍ Huang, E.; Bassett, W. A. 📂 Article 📅 1986 🏛 American Geophysical Union 🌐 English ⚖ 731 KB

Synchrotron radiation-excited glancing i

Synchrotron radiation-excited glancing incidence xrf for depth profile and thin-film analysis of light elements

✍ P. Kregsamer; Christina Streli; P. Wobrauschek; H. Gatterbauer; P. Pianetta; L. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 144 KB

First results of depth profile and thin-film analysis by glancing incidence x-ray fluorescence analysis of low-Z elements (carbon to aluminum), usually not detectable by conventional instruments, were obtained by synchrotron radiation excitation (SSRL, Beamline III-4) and by a special energy-dispers