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Determination of grain size by XRD profile analysis and TEM counting in nano-structured Cu

✍ Scribed by Yong Zhong; Dehai Ping; Xiaoyan Song; Fuxing Yin

Book ID
116604115
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
600 KB
Volume
476
Category
Article
ISSN
0925-8388

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