✦ LIBER ✦

Determination of free-electron parameters of thin films

✍ Scribed by J. Szczyrbowski; J. Dryzek; A. Czapla

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 608 KB
Volume: 112
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(84)90494-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Simultaneous determination of the scatte

Simultaneous determination of the scattering parameter and the mean free path of conduction electrons in thin films

✍ F. Abelès; Marie-Luce Thèye 📂 Article 📅 1963 🏛 Elsevier Science ⚖ 221 KB

Free electron distribution in thin films

✍ M. Pantić; Lj.M. Ristovski; Lj.D. Mašković; B.S. Tošić 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 506 KB

In this paper we analyze the electron states in metallic films. The first part of the paper is devoted to the study of the film where ion ion interaction changes only in boundary layers. It was concluded that bulk states always appear in such film. Surface states appear only if the variation of the

Determination of Kinetic Parameters of B

Determination of Kinetic Parameters of Bi2Se3 Thin Films by Computation

✍ D. Nataraj; K. Prabakar; Sa.K. Narayandass; D. Mangalaraj 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 139 KB

Determination of structure of thin films

Determination of structure of thin films by electron microscope examination

📂 Article 📅 1965 🏛 Elsevier Science 🌐 English ⚖ 126 KB

Determination of structure of thin films

Determination of structure of thin films by electron microscope examination

📂 Article 📅 1965 🏛 Elsevier Science 🌐 English ⚖ 148 KB

Determination of stoichiometry of SiOx t

Determination of stoichiometry of SiOx thin films using an Auger parameter

✍ R. Alfonsetti; L. Lozzi; M. Passacantando; P. Picozzi; S. Santucci 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 191 KB