Ionization probability of sputtered part
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Y. Kudriavtsev; S. Gallardo; A. Villegas; G. Ramirez; R. Asomoza
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Article
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2008
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Elsevier Science
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English
β 480 KB
In this paper we represent the experimental ionization probability of sputtered silicon atoms as a function of their energy, which has been obtained for positive Si + ions sputtered from silicon by O 2 + ion beam. To explain the experimental data, we have considered ionization of an outgoing atom at