Determination of electronic properties of Al/p-Si/composite organic semiconductor (MIOS) junction barrier by current–voltage and capacitance–voltage methods

✍ Scribed by Fahrettin Yakuphanoglu

• Book ID: 116898316
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 354 KB
• Volume: 158
• Category: Article
• ISSN: 0379-6779
• DOI: 10.1016/j.synthmet.2007.12.006