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Determination of CuInSe2 thin film compositions by controlled-potential coulometry

โœ Scribed by M.H. Yang; M.L. Lee; Y.M. Lin; H.L. Hwang


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
369 KB
Volume
155
Category
Article
ISSN
0040-6090

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Minority carrier diffusion lengths in thin film p-CuInSe2 and n-CdS were determined from the decay of the short-circuit current generated by the electron beam of a scanning electron microscope (SEM) for different accelerating voltages. The bulk diffusion lengths were determined taking into account t