Determination of characterizing parameters for bimaterial interface cracks using the boundary element method

✍ Scribed by Y.L. Gao; C.L. Tan

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 462 KB
• Volume: 41
• Category: Article
• ISSN: 0013-7944
• DOI: 10.1016/0013-7944(92)90160-g

✦ Synopsis

A&dract--The complex stress intensity factor, K = Kt + i&t, which is used to chara~terixe the near tip fields of a bimaterial interface crack may atso be written as K = &ti, aud it has been shown that K, is directly related to the strain energy rele8se rate. An e&ient means of obtaining this quantity 1yo using the boumhuy clement method (BEM) has &en discussed in a recent paper by the preseut authors However, some recent studies have suggested that fracture of such interfacial bonds is characterixed by critical values of K, which may vary with the phase angle $, This note describes how $ may also be determined using the BEM with quarter-point traction sing&r crack-tip elmtents. Results of some numeric81 experiments are presented to demonstrate the accuracy of the approach.

CIUCKS which occur at the interface between two dissimilar elastic materials are important in the study of, for example, failure of composite materials and solid state microelectronic devices. In the analysis of such problems, it is convenient to introduce the complex stress intensity facto@], K, defined as K = K, f X,,