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Determination of cesium distributions in oxides of MOS structures by photoinjection studies

✍ Scribed by G. Sixt; M. Schulz; A. Goetzberger


Publisher
Springer
Year
1974
Tongue
English
Weight
602 KB
Volume
4
Category
Article
ISSN
1432-0630

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A sine-voltage technique for measurements of recombination lifetime in metal oxide semiconductor (MOS) structures is proposed. When a fast sine-voltage sweep ramp is applied to the gate of an MOS capacitor a non-equilibrium depletion layer is formed and electron-hole generation starts in the space-c