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Determination of boron in the thin surface layer of a silicon wafer by instrumental charged particle activation analysis

โœ Scribed by H. Yonezawa; C. Yonezawa; T. Shigematsu


Book ID
112674653
Publisher
Springer
Year
1995
Tongue
English
Weight
400 KB
Volume
198
Category
Article
ISSN
1588-2780

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## Abstract Charged particle activation analysis is used for the determination of boron, carbon and nitrogen in zircaloy. Carbon can be determined instrumentally using the ^12^C (d,n) ^13^N reaction. For the determination of boron and nitrogen the ^10^B (d, n) ^11^C and the ^14^N (ฮฑ, ฮฑn) ^13^N reac