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Determination of a correction factor for the interaction potential of He+ ions backscattered from a Cu(1 0 0) surface

✍ Scribed by M. Draxler; M. Walker; C.F. McConville


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
341 KB
Volume
249
Category
Article
ISSN
0168-583X

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The yield and the mass distribution of positive-charged secondary ions emitted from a KCl(0 0 1) surface were measured when MeV heavy ions were incident on the surface at grazing angles h i ranging from 1 to 5 mrad. Specular reflection of the projectile ions allowed us to investigate secondary ion e