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Detection of pinhole defects on chips and wafers using DCT enhancement in computer vision systems

✍ Scribed by Hong-Dar Lin; Duan-Cheng Ho

Book ID: 105851864
Publisher: Springer
Year: 2006
Tongue: English
Weight: 748 KB
Volume: 34
Category: Article
ISSN: 0268-3768
DOI: 10.1007/s00170-006-0614-3

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