Detection of deep-level (0.63 eV) radiative defects during degradation in GaAs0.6P0.4 light-emitting diodes

✍ Scribed by S. Metz; W. Fritz

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 278 KB
• Volume: 20
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(77)90098-3