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Degradation studies in GaAs0·6P0·4 Light-emitting diodes : R. H. Weissman, W. L. Snyder, G. T. Ikari and T. L. Larsen. Proc. IEEE Reliability Physics Symp. April 2–4, 1974. p. 273


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
129 KB
Volume
14
Category
Article
ISSN
0026-2714

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