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Detection limit in the (pX, X) technique—A novel method for trace element analysis

✍ Scribed by K. Jinno; K. Kawasaki; M. Sato; S. Amemiya; T. Katoh

Book ID
112765961
Publisher
Springer
Year
1983
Tongue
English
Weight
417 KB
Volume
76
Category
Article
ISSN
1588-2780

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✍ N.L. Misra; K.D. Singh Mudher 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 614 KB

## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r