Method for detailed evaluation of yield
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Kenji Hinode; Yoshihito Hashimoto; Yoshio Kameda; Tetsuro Satoh; Shinichi Yorozu
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Article
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2006
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Elsevier Science
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English
β 340 KB
We have developed a method for evaluating I c (critical current) spreading and yield of Nb Josephson junctions (JJ) through detailed current-voltage (I-V) measurements and applied the method to evaluation of 1000 serial arrays. Digitizing the stepwise I-V curve, we deduced the I c value at each volt