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Destructive single-event effects in semiconductor devices and ICs

✍ Scribed by Sexton, F.W.

Book ID: 118049181
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 782 KB
Volume: 50
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2003.813137

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