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Designing reliable systems from unreliable components: the challenges of transistor variability and degradation

✍ Scribed by Borkar, S.

Book ID: 115457773
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 216 KB
Volume: 25
Category: Article
ISSN: 0272-1732
DOI: 10.1109/mm.2005.110

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